OPT-S9000 Spectroscopic Ellipsometer
- Film thickness, refractive index, dielectric constant, etc. measurement
- Spectral range UV-VIS 250-1700 nm
- Step scan analyzer for high speed
- Widest variable angle (20 ° -90 °)
- Light source: 75 W Xe Lamp
- 160mm diameter height and inclination adjustable holder
ZeeScope Optical Profilometer
- High resolution digital microscopy, accurate Z depth measurement, fast 3D acquisition and analysis, automatic depth composition, 3D surface metrology
- 3D surface analysis in micrometer and nanometer range
- ISO roughness and step heights measurements
- Light source: Internal coaxial LED light source
- Camera: 1 / 1.8 ” CCD 1616 x 1216 4.40 frame pixels, 12fps
- Power supply: 110 / 220V AC
- Measuring range: Ra, Rq: 0.01‐500µm
- Measurement accuracy: ≤ ± 10%
- Repeatability: ≤6%