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ZeeScope Optical Profilometer (Surface Characterization)

28 November 2024

ZeeScope Optical Profilometer (Surface Characterization)

The ZeeScope optical profilometer is a non-destructive device used for measuring and analyzing the topography of surfaces. This profilometer is designed to precisely measure surface features in the micrometer and nanometer range, providing fast and accurate 2D and 3D measurements. It uses an internal coaxial LED light source to measure surface morphology, roughness, step heights, and other topographic features.

Key Features:

  • Measurement Method:
    • The optical profilometer uses a light source to non-destructively analyze the topography of a surface.
    • 2D and 3D measurements can be taken from a single point, a line, or an area.
    • 3D surface mapping allows for the detection of surface morphology, roughness, and step height.
  • High-Resolution Digital Microscopy:
    • 2D and 3D surface analysis is performed within the micrometer and nanometer range.
    • Fast 3D data collection and analysis, along with precise Z-depth measurements.
    • Automatic depth composition enhances measurement efficiency.
  • Surface Parameters:
    • Provides 12 different analysis parameters, including commonly used Ra (Sa), Rq (Sq), and Rz (Sz) parameters.
    • Accurate analysis of surface roughness, step heights, and other topographic features.
  • Non-Destructive Measurement:
    • The optical profilometer is non-destructive, meaning it does not damage the sample, making it ideal for delicate or fragile surfaces.
  • Light Source and Camera:
    • Light Source: Internal coaxial LED light source for high-quality illumination.
    • Camera: 1/1.8” CCD camera with 1616 x 1216 resolution, 4.40 micrometer square pixel size, and 12 fps data collection speed.
  • Measurement Range and Accuracy:
    • Ra, Rq Measurement Range: 0.01 µm – 500 µm.
    • Measurement Accuracy: ≤ ± 10%, ensuring reliable measurements.
    • Repeatability: ≤ 6%, guaranteeing consistency in measurement results.
  • Dimensions and Weight:
    • ZeeScope Head: 225 mm (H) x 40 mm (W) x 55 mm (D), 425 g.
    • Control Unit: 40 mm (H) x 158 mm (W) x 150 mm (D), 150 g.
  • PC Interface:
    • USB 2.0 connectivity for integration with a computer, allowing measurement results to be easily recorded and analyzed.

Applications:

  • Surface Roughness Analysis: Used to analyze surface roughness and homogeneity of materials.
  • Semiconductor and Nanotechnology: Ideal for applications requiring high precision, particularly for the surface characterization of electronic and optical components.
  • Manufacturing Quality Control: Enables the monitoring of surface features in production processes and ensures quality control.
  • Nanomaterial Characterization: Allows for the detailed analysis of nanoscale surfaces.

The ZeeScope Optical Profilometer is a highly reliable and precise device for surface analysis, offering non-destructive measurement features that make it ideal for applications in material science, production processes, and nanotechnology.