28 November 2024

ZeeScope optical profilometer is a non-destructive device used for measuring and analyzing the topography of surfaces. This profilometer is designed to precisely measure surface features in the micrometer and nanometer range, providing fast and accurate 2D and 3D measurements. Profilometer surface morphology: Topographic features of the surface, such as step heights and surface roughness, are obtained.

• High-resolution digital microscopy, accurate Z-depth measurement, fast 3D acquisition and analysis, and automatic depth composition.
• 2D and 3D surface analysis in the micrometer and nanometer range.
• A total of 12 analysis parameters are provided, including commonly used parameters Ra (Sa), Rq (Sq), and Rz (Sz).
• The optical profilometer is non-destructive and does not damage the sample.
• Light source: Built-in coaxial LED light source
• Camera: 1/1.8” CCD, 1616 x 1216 resolution, 4.40 μm square pixels, 12 fps
• Power supply: 110/220V AC
• Measuring range: Ra, Rq: 0.01 ‐ 500 µm
• Measuring accuracy: ≤ ± 10%
• Repeatability: ≤6%
• Dimensions & Weight (ZeeScope Head): 225 (H) x 40 (W) x 55 (D) mm, 425 g
• Dimensions & Weight (Control unit): 40 (H) 158 (W) 150 (D) mm, 150 g
• PC Interface: USB 2.0