Our center director, Assoc. Prof. Dr. İlkay Demir, participated as an invited speaker at the “International Workshop on Advanced Characterization Techniques for Materials (ACTM-2025),” held in Tunisia from June 11 to 14. He delivered a presentation titled “High Resolution X-Ray Diffraction Analysis of Epitaxial III-V Semiconductors for Optoelectronic Applications.”
16 June 2025
During the visit, an important collaboration protocol was also signed between our center and the team led by Prof. Dr. Anouar Njeh, Director of the Laboratory of Physics of Materials at the Faculty of Science of Sfax, University of Sfax.
We sincerely thank the ACTM-2025 organizing committee for their kind invitation and warm hospitality. We believe that this collaboration will continue successfully in our future joint projects
