29 November 2024

NanoMap LS 500 Contact Profilometer is a highly precise instrument used for analyzing the surface topography of materials at a microscopic scale. It is used to detect traditional surface features such as surface roughness, step height, curvature, and shape for various types and sizes of materials. Offering vertical ranges up to 1.3 mm, the device can measure vertical features at the nanometer scale with resolution as fine as 0.5 nm. To ensure the complete elimination of noise, the NanoMap-500LS is equipped with vibration-damping Peddler and an acoustic enclosure box.

• 2D and 3D scanning can be performed.
  2D scanning provides a line profile.
  3D scanning conducts an area scan and provides a height profile.

• Scanning Modes:
  • Short Scan Mode: Range: 10 µm to 500 µm
  • Long Scan Mode: Range: 500 µm to 100,000 µm
• Height Measurement: Two sensors at the probe tip:

• Fine Sensor:Vertical measurement range of 5 µm, used for measuring minute changes in surface roughness and small vertical features.
• Coarse Sensor:Vertical measurement range of 500 µm, used for measuring surfaces with larger depths.
• Probe tip contact force: Applicable between 0.1 mg and 100 mg.

• Measurement Speed:
  • Short Scan:
    • High: 35 µm/s
    • Medium: 17 µm/s
    • Low: 11 µm/s
  • Long Scan:
    • 50 µm/s to 5000 µm/s

Data Analysis:

• 2D Data Analysis:
  • Height statistical measurement
  • Step height measurement
  • Surface roughness measurement
• 3D Data Analysis:
  • Height statistical measurement
  • Step height measurement
  • Surface roughness measurement
  • 3D histogram analysis
  • Volume measurement