9 December 2024
It is used for measuring semiconductor structures and devices, including DC I-V, C-V, and pulse characterization.
±210 V / 100 mA or ±210 V / 1 A module, 100 fA measurement resolution, 10 mA measurement resolution with an optional PreAmp, and 10 mHz–10 Hz very low-frequency capacitance.
4-quadrant operation, 2 or 4-wire connection
AC impedance measurements (C-V, C-f, C-t), 1 kHz–10 MHz frequency range, ±30 V (60 V differential) built-in DC polarity, ±210 V (420 V differential), and simple switching between I-V and C-V measurements with the optional CVIV Multi-Switch.
Two independent or synchronized channels act as high-speed pulsed I-V sources and measurement units, offering 200 MSa/sec sampling at 5 ns, ±40 V (80 Vp-p), ±800 mA, transient waveform capture mode, and an arbitrary waveform generator for multi-level pulse waveforms with 10 ns programmable resolution.
Two channel high-speed pulsed V source, ±40 V (80 Vp-p), ±800 mA, arbitrary waveform generator for multi-level pulse waveform with 10 ns programmable resolution Segment ARB® mode
Easily switch between I-V and C-V measurements without reconnecting or removing probe needles, move C-V measurement to any terminal without reconnecting or removing probe needles, ±210 V DC forwarding capability
Automatically switches between I-V, C-V, and ultra-fast pulsed I-V measurements, enhancing the 4225-PMU’s current sensitivity to tens of picoamps while minimizing the effects of cable capacitance.