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High-Performance Atomic Force Microscope (hp AFM) (Surface Characterization)

30 November 2024

Atomic Force Microscope (AFM) (Surface Characterization)

The Atomic Force Microscope (AFM) is a high-resolution imaging tool that allows researchers to examine surfaces at the nanometer scale. The principle of operation involves a sharp tip mounted on a cantilever that scans the surface of a sample. As the tip moves across the sample, the forces between the tip and the surface cause the cantilever to deflect. These deflections are detected by a laser beam reflected from the cantilever to a photodetector. AFM can operate in various modes, such as contact and non-contact modes, depending on the nature of the interaction between the tip and the surface. The data obtained from AFM enables the creation of topographical maps of the surface, providing measurements of surface roughness, texture, and other surface properties. Additionally, AFM can provide information about mechanical properties such as hardness, adhesion, and elasticity, making it a versatile tool for material characterization.

Key Features:

  • XY Scanning Range: 2 µm ~ 100 µm
  • Z Scanning Range: 5 µm ~ 15 µm
  • Resolution: 0.01 nm
  • Imaging: Up to 8192 x 8192 pixels
  • XY Sample Scanning Load Capacity: 500 g

Motorized XYZ Stage:

  • Z Motor Range: 50 mm, 250 nm resolution
  • XY Motor Range: 76 mm, 50 nm resolution

Laser:

  • Low Noise, RF Modulated 635 nm Laser

Cantilever:

  • >14 nm Tip “Sharp Cantilever”
  • Automatic Cantilever Frequency Detection

Camera:

  • X10 Objective with Motorized Focus
  • 1 µm Optical Resolution
  • Adjustable White Light Source

Isolation:

  • Acoustic, Thermal, and Vibration Isolation Chamber
  • 0.5 Hz Vibration Isolation Table in XYZ Directions

Modes:

  • Contact Mode
  • Dynamic Mode
  • Phase Imaging
  • Force-Distance Curve Spectroscopy
  • 3D Imaging Capability

This AFM is a high-performance tool for surface characterization, enabling detailed imaging and measurement of material properties with exceptional resolution. It is suitable for a wide range of applications, including the study of nanomaterials, thin films, biological samples, and more.