30 November 2024

Atomic Force Microscope (AFM) is a high-resolution imaging tool that allows researchers to examine surfaces at the nanometer scale. The working principle of AFM involves a sharp tip mounted on a Cantilever and scans the surface of a sample.. As the tip moves across the sample, the forces between the tip and the surface cause the cantilever to deflect. These deflections are detected by a laser beam reflected from the cantilever to a photodetector. AFM can operate in various modes, such as contact and non-contact modes, depending on the nature of the interaction between the tip and the surface. The data obtained from AFM enables the creation of topographical maps of the surface, providing measurements of surface roughness, texture, and other surface properties. Additionally, AFM can provide information about mechanical properties such as hardness, adhesion, and elasticity, making it a versatile tool for material characterization.

• XY Scanning Range: 2 µm ~ 100 µm
• Z Scanning Range: 5 µm ~ 15 µm
• Resolution: 0.01 nm
• Imaging: Up to 8192 x 8192 pixels
• XY Sample Scanning Load Capacity: 500 g
• Motorized XYZ Stage:
• Z Motor Range: 50 mm, 250 nm resolution
• XY Motor Range: 76 mm, 50 nm resolution
• Laser:
• Low Noise, RF Modulated 635 nm Laser
• Cantilever:
• >14 nm Tip “Sharp Cantilever”
• Automatic Cantilever Frequency Detection
• Camera:
• X10 Objective with Motorized Focus
• 1 µm Optical Resolution
• Adjustable White Light Source
• Isolation:
• Acoustic, Thermal, and Vibration Isolation Chamber
• 5 Hz Vibration Isolation Table in XYZ Directions
• Modes:
• Contact Mode
• Dynamic Mode
• Phase Imaging
• Force-Distance Curve Spectroscopy
• 3D Imaging Capability