AIXTRON 200/4 RF-S Metalorganic Chemical Vapor Deposition (MOCVD) Method
Publication Date: 31 December 2024, 15:28
Technical Specifications
HOGEN S40 S-Series Hydrogen Generator
Publication Date: 26 December 2024, 15:44
Technical Specifications
Nikon Eclipse LV150N Optical Microscope (Optical Characterization)
Publication Date: 25 December 2024, 16:10
Technical Specifications
Nomarski Mode Material Microscope (Surface Characterization)
Publication Date: 24 December 2024, 16:12
Technical Specifications
VS Series Helium Mass Spectrometer Leak Detector
Publication Date: 22 December 2024, 16:16
Technical Specifications
Nanovak (NVTS-500-2TH1DC1RF) Sputter/Thermal Thin Film Deposition System
Publication Date: 21 December 2024, 16:17
Technical Specifications
Heidolph MR Hei-Tec Magnetic Stirrer
Publication Date: 17 December 2024, 16:23
Technical Specifications
Laurell WS-650MZ-23NPPB Spin Coater
Publication Date: 14 December 2024, 16:27
Technical Specifications
Rigaku SmartLab High-Resolution X-Ray Diffraction (Structural Characterization)
Publication Date: 13 December 2024, 16:28
Technical Specifications
The TCA9KS05N Model Chiller is used for the Rigaku SmartLab High-Resolution X-Ray Diffraction System
Publication Date: 12 December 2024, 16:30
Technical Specifications
ProfiCool Novus PCNO 30.03-NED Mini Chiller
Publication Date: 11 December 2024, 16:32
Technical Specifications
Keithley 4200-SCS Semiconductor Characterization System
Publication Date: 9 December 2024, 16:35
Technical Specifications
A Solar Simulator Lamp (for Electrical Characterization)
Publication Date: 8 December 2024, 16:36
Technical Specifications
Kulicke and Soffa Model 4124 Ball Wire Bonder
Publication Date: 7 December 2024, 16:38
Technical Specifications
Hall Effect Measurement System (HEMS, Electrical Characterization)
Publication Date: 5 December 2024, 16:42
Technical Specifications
Unitemp-100 RTP System (Rapid Thermal Processing System)
Publication Date: 4 December 2024, 16:43
Technical Specifications
OPT-S9000 Spectroscopic Ellipsometer (Optical Characterization)
Publication Date: 3 December 2024, 16:44
Technical Specifications
Varian UV-VIS-NIR Spectrophotometer (Optical Characterization)
Publication Date: 2 December 2024, 16:46
Technical Specifications
Broad Spectrum (200 – 2200 nm) High-Resolution Photoluminescence Spectrometer System (Optical Characterization)
Publication Date: 1 December 2024, 16:48
Technical Specifications
Deluxe Power Meter (Optical Characterization)
Publication Date: 1 December 2024, 16:47
Technical Specifications
High-Performance Atomic Force Microscope (hp AFM) (Surface Characterization)
Publication Date: 30 November 2024, 16:50
Technical Specifications
NanoMap 500LS 3D Profilometer (Surface Characterization)
Publication Date: 29 November 2024, 16:51
Technical Specifications
ZeeScope Optical Profilometer (Surface Characterization)
Publication Date: 28 November 2024, 16:52
Technical Specifications