Introducing our new device: Electrochemical Capacitance-Voltage (ECV) Profiling System!
20 January 2025
The Electrochemical Capacitance-Voltage (ECV) technique is used to measure active carrier concentration profiles in semiconductor layers. This technique is a common characterization method to investigate the doping profiles of semiconductor layers by changing the conditions at the semiconductor/electrolyte interface, resulting in a controlled etching of the material, with a depth-based CV measurement.
ECV plays a crucial role in material and device evaluation, both in research laboratories and the semiconductor industry. It is especially valuable in the development of optoelectronic technologies. With this innovative method, we strive to achieve more precise and reliable results in our research and development processes.
