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Growth with AIXTRON 200/4 RF-S MOCVD
Growth with NVTS-500-2TH1DC1RF Sputter / Thermal Evaporation
Room Temperature Hall Measurement (RT-HEMS)
Low Temperature Hall Measurement (LT-HEMS)
IV/CV Measurement with Keithley 4200-SCS Semiconductor Characterization System
Temperature-Dependent IV/CV Measurement with Keithley 4200-SCS Semiconductor Characterization System
I-V Measurement with Ossila Solar Simulator
Thin Film Measurement with Rigaku SmartLab High-Resolution X-Ray Diffraction System
Powder Sample Measurement with Rigaku SmartLab High-Resolution X-Ray Diffraction System
Simulation/Analysis
X-Ray Reflectometry (XRR) with Rigaku SmartLab High-Resolution X-Ray Diffraction System
Unidron RT-PL
LT-PL
Raman Mapping
Raman Spectroscopy Measurement
Nanomap LS 500 Contact Profilometer
ZeeScope Optical Profilometer
High-Performance Atomic Force Microscope Contact Mode/Dynamic Mode
Reflection, Transmittance, and Absorption with Varian Cary 5000 UV-VIS-NIR Spectrophotometer
RT Measurement with OPT-S9000 Spectroscopic Ellipsometer
Temperature-Dependent Measurement with OPT-S9000 Spectroscopic Ellipsometer
Nikon Eclipse LV150N Optical Microscope
Zeiss Axiolab 5 Nomarski Microscope
VS Series Helium Mass Spectrometer Leak Detector
Unitemp-100 Rapid Thermal Annealing
Kulicke and Soffa Model 4124 Gold Wire Bonder
Electrochemical Capacitance-Voltage Measurement (ECV)
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